Methods utilizing triangulation in metrology systems for in-situ surgical applications

ABSTRACT

A first metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size, and determining a dimension of a target object by comparing the aligned image to the target object. A second metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size by synchronously adjusting a zoom factor for projecting the first image and an angle for projecting the second image, and determining a dimension of a target object by comparing the aligned image to the target object.

BACKGROUND

This application is a continuation of U.S. patent application Ser. No.13/448,429, filed Apr. 17, 2012, which claims the benefit of andpriority to U.S. Provisional Patent Application No. 61/487,750, filedMay 19, 2011, the entire disclosure of which is incorporated byreference herein.

BACKGROUND

1. Technical Field

The present disclosure relates to a method for measuring a dimension ofa target site. More particularly, the present disclosure relates to amethod of triangulation for creating an image of a predetermined sizefor use in measuring a dimension of a target site.

2. Background of the Related Art

Minimally invasive surgery, e.g., laparoscopic, endoscopic, andthoroscopic surgery, has many advantages over traditional opensurgeries. In particular, minimally invasive surgery eliminates the needfor a large incision, thereby reducing discomfort, recovery time, andmany of the deleterious side effects associated with traditional opensurgery.

The minimally invasive surgeries are performed through small openings ina patient's skin. These openings may be incisions in the skin or may benaturally occurring body orifices (e.g., mouth, anus, or vagina). Ingeneral, insufflation gas is used to enlarge the area surrounding thetarget surgical site to create a larger, more accessible work area.

During minimally invasive procedures, it is often difficult for asurgeon to determine sizes of various organs, tissues, and otherstructures in a surgical site. Various in-situ surgical metrologymethods exist for measurement in a surgical site. Such methods requiremany moving parts and projection images that change size and/or focusquickly as projectors move in or out of a surface of projection. Acontinuing need exists for in-situ surgical metrology methods thatoperate with a stable focus and no moving parts.

SUMMARY

A first metrology method includes the steps of projecting a first imageand a second image, aligning the first image and the second image toform an aligned image of a known size by moving an instrument towardsand away from a target object, and determining a dimension of a targetobject by comparing the aligned image to the target object. The alignedimage may include aligned circles. The aligned image may include asingle point aligned with a center point of a circle. The projecting ofat least one of the first image and second image may be achieved by apoint source projector. A single beam may be split to project the firstimage and the second image.

A second metrology method includes the steps of projecting a first imageand a second image, aligning the first image and the second image toform an aligned image of a known size by synchronously adjusting a zoomfactor for projecting the first image and an angle for projecting thesecond image, and determining a dimension of a target object bycomparing the aligned image to the target object. The aligned image mayinclude aligned circles. The aligned image may include a single pointaligned with a center point of a circle. The projecting of at least oneof the first image and second image may be achieved by a point sourceprojector. A single beam may be split to project the first image and thesecond image.

In other embodiments the metrology system may be a standalone device,while projected pattern is observed through a separate endoscope.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other aspects, features, and advantages of the presentdisclosure will become more apparent in light of the following detaileddescription when taken in conjunction with the accompanying drawings inwhich:

FIG. 1 is a side, schematic view of a metrology system according to theprinciples of the present disclosure;

FIG. 2 is a side, schematic view of a projector of the metrology systemof FIG. 1;

FIG. 3 is a side, perspective view of a method of use of the metrologysystem of FIG. 1;

FIG. 4 is a side, schematic view of a metrology system according toanother embodiment of the present disclosure;

FIG. 5 is a side, schematic view of a metrology system according toanother embodiment of the present disclosure; and

FIG. 6 is a side, perspective view of a method of use of the metrologysystem of FIG. 5.

DETAILED DESCRIPTION

Particular embodiments of the present disclosure are describedhereinbelow with reference to the accompanying drawings; however, it isto be understood that the disclosed embodiments are merely exemplary ofthe disclosure and may be embodied in various forms. Well-knownfunctions or constructions are not described in detail to avoidobscuring the present disclosure in unnecessary detail. Therefore,specific structural and functional details disclosed herein are not tobe interpreted as limiting, but merely as a basis for the claims and asa representative basis for teaching one skilled in the art to variouslyemploy the present disclosure in virtually any appropriately detailedstructure.

Like reference numerals may refer to similar or identical elementsthroughout the description of the figures. As shown in the drawings anddescribed throughout the following description, as is traditional whenreferring to relative positioning on a surgical instrument, the term“proximal” refers to the end of the apparatus which is closer to theuser and the term “distal” refers to the end of the apparatus which isfarther away from the user. The term “clinician” refers to any medicalprofessional (i.e., doctor, surgeon, nurse, or the like) performing amedical procedure involving the use of embodiments described herein.

As seen in FIG. 1, a metrology system 10 according to an embodiment ofthe present disclosure is illustrated. Metrology system 10 utilizesprojectors 100 for projecting light beams 110 at intersecting angles.Projectors 100 include a projector 100 a and a projector 100 b. Someembodiments may utilize more than two projectors 100. Other embodimentsmay only have one projector 100, as will be described in greater detailhereinbelow. In metrology system 10, projector 100 a and projector 100 bare substantially identical and project substantially identical lightbeams 110 a, 110 b, respectively.

Light beams 110 form an image 120 including an image 120 a from lightbeam 110 a and an image 120 b from light beam 110 b. Images 120 a, 120 bsubstantially align to form a substantially aligned image 122 having apredetermined size on an image plane p₂ at a distance d₂ from pointsources 102 (FIG. 2) of projectors 100. Image plane p₂ is the only imageplane on which images 120 a, 120 b align. On an image plane p₁ at adistance d₁ less than distance d₂ from point sources 102 of projectors100, an unaligned image 121 is formed. Likewise, on an image plane p₃ ata distance d₃ greater than distance d₂ from point sources 102 ofprojectors 100, an unaligned image 123 is formed. Distance d₂ may becalculated geometrically using a distance between point sources 102 andangles of projectors 100. Distance d₂ may also be determinedexperimentally. Similarly, the predetermined size of aligned image 122may be determined geometrically or experimentally.

Images 120 a, 120 b may be any shapes appropriate for determining analignment of thereof. For example, images 120 a, 120 b may be circlesthat concentrically overlap on image plane p₂. Images 120 a, 120 b haveuniformly spaced markings. In other embodiments, an endoscope or otherdevice may provide uniformly spaced markings When image 122 is formed,the uniformly spaced markings have a predetermined distance therebetweento assist in determining a measurement of a dimension on image plane p₂.The predetermined distance of the uniformly spaced markings may bedetermined geometrically or experimentally. Although images 120 a, 120 bare substantially identical in metrology system 10, other embodimentsmay have differing shapes of images 120 a, 120 b.

As seen in FIG. 2, a projector 100 includes a point source 102 and amask 104. Point source 102 emits a light beam 110. Various embodimentsof point source 102 include a laser diode, a light-emitting diode, and alens for shaping a beam of light. Mask 104 is positioned between pointsource 102 and the target site. Mask 104 has a pattern 106 disposedthereon in a shape of a desired image 120, such as a series ofconcentric, uniformly spaced circles. Light beam 110 may be collimatedfor increased sharpness of image 120. Light beam 110 is partiallyblocked upon incidence with mask 104. A portion of light beam 110 thatpasses through mask 104 forms a magnified pattern 116 as a portion ofimage 120.

A magnification factor of pattern 106 to pattern 116 is calculatedaccording a formula: M=1+x_(b)/x_(a), where M is the magnificationfactor, x_(a) is a distance between point source 102 and mask 104, andx_(b) is a distance between mask 104 and the target site. Accordingly,image 120 may be enlarged when x_(b) is increased or x_(a) is decreased.Image 120 may shrink upon an increase of x_(a) or a decrease of x_(b).Mask 104 may be translated with respect to the target site to increaseor decrease x_(a) and x_(b). Metrology system 10 may be translated toincrease or decrease x_(b). Point source 102 is sufficiently small foredges of image 120 to remain substantially sharp as a size of image 120changes.

A method of use of metrology system 10 will now be described. As seen inFIG. 3, metrology system 10 may be attached to a distal end of anendoscope “E”. Endoscope “E” is inserted into a body cavity “C” throughan opening in a tissue “T”. Endoscope “E” may be inserted through a sealanchor “R” positioned in the opening in tissue “T”. Projectors 100project image 120 onto a target site “S” within cavity “C”. A clinicianmay observe image 120 through endoscope “E”. If images 120 a, 120 b arenot aligned, endoscope “E” is translated distally or proximally untilpoint sources 102 of projectors 100 are at distance d₂ from target site“S”. Once aligned image 122 is formed on target site “S”, thepredetermined size of aligned image 122 and the predetermined distanceof the uniformly spaced markings thereon may be used to measure adimension of target site “S”. A dimension of target site “S” is measuredby visually inspecting and counting a number of uniformly spacedmarkings appearing along the dimension of target site “S”. The number ofuniformly spaced markings is multiplied by the predetermined distancetherebetween to calculate the measure of the dimension of target site“S”.

Turning to FIG. 4, a metrology system in accordance with an alternateembodiment of the present disclosure is generally designated as 20.Metrology system 20 is similar to metrology system 10 and thus will onlybe discussed as necessary to identify the differences in constructionand operation thereof.

Metrology system 20 has a projector 200, a splitter 212, and a reflector214. Projector 200 is substantially identical to projector 100 (FIG. 2)and projects a light beam 210. Splitter 212 splits light beam 210 intolight beams 210 a, 210 b. Embodiments of splitter 212 include prisms andmirrors. Light beam 210 a passes through splitter 212. Light beam 210 bis reflected by splitter 212 onto reflector 214. Reflector 214 reflectslight beam 210 b at an angle a for intersection with light beam 210 a.

Light beams 210 form a substantially aligned image 222 on an image planep₂ at a distance d₂ from a point source of projector 200. Image plane p₂is the only image plane on which a substantially aligned image isformed. Light beams 210 project a pattern having uniformly spacedmarkings onto image plane p₂. Distance d₂, a distance of the uniformlyspaced markings, and a size of aligned image 222 may be determinedgeometrically or experimentally.

Light beams 210 produce images of any shapes appropriate for determiningan alignment of thereof. In some embodiments, a total overlap of certainelements of the images of light beams 210 may not occur due to lightbeam 210 a travelling a shorter total distance than light beam 210 b toreach image plane p₂. In such embodiments, an alignment of a point or aline may be an ideal indicator of alignment. For example, light beam 210a may project a circle with a center point, and light beam 210 b mayproject a single point for aligning with the center point of the imageprojected by light beam 210 a.

A method of use of metrology system 20 is substantially identical to themethod of use of metrology system 10 described hereinabove.

Turning to FIG. 5, a metrology system in accordance with an alternateembodiment of the present disclosure is generally designated as 30.Metrology system 30 is similar to metrology system 20 and thus will onlybe discussed as necessary to identify the differences in constructionand operation thereof

Metrology system 30 includes a projector 300, a splitter 312, areflector 314, and an actuator 330 (FIG. 6). Projector 300 includes apoint source 302 and a mask 304. Mask 304 is a distance x_(an) away frompoint source 302 and distances x_(bn) away from image planes p_(n).Point source 302 emits a light beam 310 that passes through a pattern306 on mask 304. Splitter 312 splits light beam 310 into light beams 310a, 310 b. Light beam 310 a passes through splitter 312 and forms a firstimage on an image plane p_(n). Light beam 310 b is reflected by splitter312 onto reflector 314. Reflector 314 is rotatable to reflect light beam310 b at any of angles a_(n) onto image planes p_(n) to form a secondimage. The first image and the second image form a substantially alignedimage 322 on an image plane p_(n) having a distance d_(n) from pointsource 302 when reflector 314 reflects light beam 310 b at a particularangle {acute over (α)}_(n). For each image plane p_(n), only angle α_(n)provides for a projection of substantially aligned image 322.Substantially aligned image 322 has a magnified pattern 316 thereon.Magnified pattern 316 is a magnification of pattern 306 and includesuniformly spaced markings thereon having a predetermined distance onimage plane p_(n).

Actuator 330 is operably coupled to mask 304 and reflector 314. Amanipulation of actuator 330 rotates reflector 314, thus changing anangle α_(n) and an image plane p_(n) on which aligned image 322 isformed. Actuator 330 translates mask 304 a distance to maintain apredetermined size of image 322. The translation of mask 304 and therotation of reflector 314 are synchronous upon a manipulation ofactuator 330. A relationship between the translation of mask 304 and therotation of reflector 314 is described according to the followingformulas:

d ₂ /d ₁=tan(α₁)/tan(α₂)=M ₁ /M ₂

M=1 +x _(b) /x _(a)

d=x _(a) +x _(b)

In the formulas above, the values of d₁, α₁, and M₁ respectivelyrepresent an initial distance d_(n), angle α_(n), and magnificationM_(n) of system 30. The values of d₂, α₂, and M₂ respectively representa resulting distance d_(n), angle α_(n), and magnification M_(n) ofsystem 30 after actuator 330 is manipulated.

A method of use of metrology system 30 is similar to the method of useof metrology system 10 described hereinabove. As seen in FIG. 6,metrology system 30 is attached to a distal end of an endoscope “E”.Endoscope “E” is inserted into a body cavity “C” through an opening in atissue “T”. Projector 300 projects light beams 310 a, 310 b onto atarget site “S” within cavity “C”. A clinician may observe an imageformed by light beams 310 a, 310 b through endoscope “E”. Ifsubstantially aligned image 322, is not formed on target site “S”,actuator 330 is rotated until substantially aligned image 322 is formedon target site “S”. The predetermined size of substantially alignedimage 322 and the uniformly spaced markings of magnified pattern 316 maythen be used to measure a dimension of target site “S”.

It should be understood that the foregoing description is onlyillustrative of the present disclosure. Various alternatives andmodifications can be devised by those skilled in the art withoutdeparting from the disclosure. Accordingly, the present disclosure isintended to embrace all such alternatives, modifications and variances.The embodiments described with reference to the attached drawing figs.are presented only to demonstrate certain examples of the disclosure.Other elements, steps, methods and techniques that are insubstantiallydifferent from those described above and/or in the appended claims arealso intended to be within the scope of the disclosure.

1-10. (canceled)
 11. A metrology method comprising: projecting a firstimage and a second image on an image plane; aligning the first image andthe second image on a target site different from the image plane; andmeasuring a dimension of the target site by counting uniformly spacedmarkings formed by the aligned first and second images.
 12. Themetrology method according to claim 11, wherein aligning the first imageand the second image on the target site includes forming an alignedimage of a known size.
 13. The metrology method according to claim 11,wherein measuring the dimension of the target site includes countinguniformly spaced circles formed by the aligned first and second images.14. A metrology method comprising: projecting first and second images onan image plane; aligning the first image and the second image on atarget site different from the image plane by synchronously adjusting azoom factor for projecting the first image and an angle for projectingthe second image; and measuring a dimension of the target site byvisually comparing the aligned first and second images with the targetsite.
 15. The metrology method according to claim 14, wherein projectingthe first and second images includes projecting a light beam through apattern on a mask.
 16. The metrology method according to claim 14,wherein measuring the dimension of the target site includes countinguniformly spaced markings formed by the aligned first and second images.17. The metrology method according to claim 14, wherein aligning thefirst image and the second image on the target site includes forming analigned image of a known size.
 18. The metrology method according toclaim 14, wherein projecting the first and second images on the imageplane includes projecting at least one of the first image and the secondimage by a point source projector.
 19. The metrology method according toclaim 14, wherein projecting the first and second images includessplitting a single beam.
 20. The metrology method according to claim 14,wherein projecting the first and second images includes projecting thefirst and second images using two projectors.